制造商 | 部件名 | 数据表 | 功能描述 |
Keysight Technologies |
4082A
|
297Kb / 21P |
Parametric Test System
|
U2941A
|
1Mb / 6P |
Parametric Test Fixture
|
Sanyo Semicon Device |
LC75281E
|
176Kb / 10P |
Parametric Equalizer System
|
Keysight Technologies |
E6708A
|
98Kb / 4P |
RF Parametric and Functional Test
|
Agilent(Hewlett-Packard... |
N9201A
|
115Kb / 4P |
Array Structure Parametric Test Option
|
ATMEL Corporation |
ATTINY102
|
411Kb / 2P |
1KB in-system programmable Flash memory
|
AT89C51
|
148Kb / 17P |
4K Bytes of In-System Reprogrammable Flash Memory
|
AT89C52
|
204Kb / 24P |
8K Bytes of In-System Reprogrammable Flash Memory
|
Sanyo Semicon Device |
LV3100M
|
425Kb / 9P |
Parametric Equalizer
|
Samsung semiconductor |
K9XXG08UXB
|
564Kb / 36P |
FLASH MEMORY
|